This dataset includes the ANYLOGIC models utilized in the IEEE SJ Paper Development and Application of a New System of Systems Resilience Metric

 

 

 

Instructions: 

These are ANYLOGIC Models. They can be run by downloading ANYLOGIC PLE. 

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Supplementary materials of the paper titled 

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Printed cirquit boards with charge coupled devices for on-chip lensless microscopes may be tested not in wetherometers and under solar simulators, but also under the experimental spectroreflectometric setup based on DATACOLOR 3890 with microphotometric and RS232-port-assisted data transfer into the PC memory.

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