Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.

Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.

Citation Author(s):
Nasirov P.A., Gradov O.V.
Submitted by:
Oleg Gradov
Last updated:
Thu, 11/08/2018 - 10:34
DOI:
10.21227/9wmx-kb90
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Abstract: 

Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.

 

FILE 1: Combined nanosecond reflectometric and stroboscopic oscilloscopic analysis for RF lab-on-a-chip.mp4

00:15 - Wavelength: 405 nm (DPSS);

00:57 - Wavelength: 650 nm (laser diode source);

 

FILE 2: Analog angle-sensitive pixel lab-on-a-chip testing using nanosecond stroboscopic oscilloscope.mp4

00:20 - Zero Point Calibration (ZPC);

00:34 - R-channel calibration;

01:01 - R-channel in pulse regime;01:37 - R-channel; laser measurements in darkfield conditions;

02:17 - reversive transitions reflectometry in nanosecond time range (and more);

02:30 - B-channel; 405 nm laser diode source;

02:54 - strobiong regime exit

 

 

Acknowledgements:

  • “Development of the novel physical methods for complex biomedical diagnostics based on position-sensitive mapping with the angular resolution at the tissue and cellular levels using analytical labs-on-a-chip” (RFBR grant # 16-32-00914) [6 838,27 $ per year];
  • “Lab-on-a-chip development for personalized diagnostics” (FASIE grant 0019125) [3 039,00 $ per year].

 

 

 

Instructions: 

Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.

 

FILE 1: Combined nanosecond reflectometric and stroboscopic oscilloscopic analysis for RF lab-on-a-chip.mp4

00:15 - Wavelength: 405 nm (DPSS);

00:57 - Wavelength: 650 nm (laser diode source);

 

FILE 2: Analog angle-sensitive pixel lab-on-a-chip testing using nanosecond stroboscopic oscilloscope.mp4

00:20 - Zero Point Calibration (ZPC);

00:34 - R-channel calibration;

01:01 - R-channel in pulse regime;01:37 - R-channel; laser measurements in darkfield conditions;

02:17 - reversive transitions reflectometry in nanosecond time range (and more);

02:30 - B-channel; 405 nm laser diode source;

02:54 - strobiong regime exit

 

 

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[1] Nasirov P.A., Gradov O.V., "Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.", IEEE Dataport, 2018. [Online]. Available: http://dx.doi.org/10.21227/9wmx-kb90. Accessed: Sep. 18, 2019.
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url = {http://dx.doi.org/10.21227/9wmx-kb90},
author = {Nasirov P.A.; Gradov O.V. },
publisher = {IEEE Dataport},
title = {Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.},
year = {2018} }
TY - DATA
T1 - Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.
AU - Nasirov P.A.; Gradov O.V.
PY - 2018
PB - IEEE Dataport
UR - 10.21227/9wmx-kb90
ER -
Nasirov P.A., Gradov O.V.. (2018). Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.. IEEE Dataport. http://dx.doi.org/10.21227/9wmx-kb90
Nasirov P.A., Gradov O.V., 2018. Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.. Available at: http://dx.doi.org/10.21227/9wmx-kb90.
Nasirov P.A., Gradov O.V.. (2018). "Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.." Web.
1. Nasirov P.A., Gradov O.V.. Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements. [Internet]. IEEE Dataport; 2018. Available from : http://dx.doi.org/10.21227/9wmx-kb90
Nasirov P.A., Gradov O.V.. "Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.." doi: 10.21227/9wmx-kb90