Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.

FILE 1: Combined nanosecond reflectometric and stroboscopic oscilloscopic analysis for RF lab-on-a-chip.mp4

00:15 - Wavelength: 405 nm (DPSS);

00:57 - Wavelength: 650 nm (laser diode source);

FILE 2: Analog angle-sensitive pixel lab-on-a-chip testing using nanosecond stroboscopic oscilloscope.mp4

00:20 - Zero Point Calibration (ZPC);