Nasirov P.A., Gradov O.V.

Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.

 

FILE 1: Combined nanosecond reflectometric and stroboscopic oscilloscopic analysis for RF lab-on-a-chip.mp4

00:15 - Wavelength: 405 nm (DPSS);

00:57 - Wavelength: 650 nm (laser diode source);

 

FILE 2: Analog angle-sensitive pixel lab-on-a-chip testing using nanosecond stroboscopic oscilloscope.mp4

00:20 - Zero Point Calibration (ZPC);

DOI Link: 
10.21227/9wmx-kb90
Links or DOI: 
Combined nanosecond reflectometric and stroboscopic oscilloscopic analysis for RF lab-on-a-chip
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Nasirov P.A., Gradov O.V. [1] Nasirov P.A., Gradov O.V., "Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.", IEEE Dataport, 2018. [Online]. Available: http://dx.doi.org/10.21227/9wmx-kb90. Accessed: Jan. 15, 2025.
@data{9wmx-kb90-18,
doi = {10.21227/9wmx-kb90},
url = {http://dx.doi.org/10.21227/9wmx-kb90},
author = {Nasirov P.A.; Gradov O.V. },
publisher = {IEEE Dataport},
title = {Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.},
year = {2018} }
TY - DATA
T1 - Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.
AU - Nasirov P.A.; Gradov O.V.
PY - 2018
PB - IEEE Dataport
UR - 10.21227/9wmx-kb90
ER -
Nasirov P.A., Gradov O.V.. (2018). Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.. IEEE Dataport. http://dx.doi.org/10.21227/9wmx-kb90
Nasirov P.A., Gradov O.V., 2018. Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.. Available at: http://dx.doi.org/10.21227/9wmx-kb90.
Nasirov P.A., Gradov O.V.. (2018). "Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.." Web.
1. Nasirov P.A., Gradov O.V.. Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements. [Internet]. IEEE Dataport; 2018. Available from : http://dx.doi.org/10.21227/9wmx-kb90
Nasirov P.A., Gradov O.V.. "Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.." doi: 10.21227/9wmx-kb90