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Power cycling test dataset (gEOL: A Gradient-based End-of-Life Criterion for Power Semiconductor Modules)
- Citation Author(s):
-
YiZhang
Aalborg UniversityHuaiWangAalborg University - Submitted by:
- Yichi Zhang
- Last updated:
- Fri, 12/01/2023 - 04:40
- DOI:
- 10.21227/ksrt-zq09
- Data Format:
- License:
616 Views- Categories:
- Keywords:
Abstract
The dataset includes on-state saturation voltage information for eight samples under four different test conditions. Each Excel file consists of two data columns: one for cycle numbers and the other for on-state saturation voltage. Although these data were collected during the power cycling test at the maximum junction temperature, the effect of temperature increase in the on-state voltage has been compensated. Namely, the provided on-state voltage has been unified to the corresponding to the respective 125°C or 150°C.
More data details can be found in the article: Y. Zhang, Y. Zhang, and H. Wang, “gEOL: A Gradient-based end-of-Life criterion for power semiconductor modules,” IEEE Trans.Power Electron.
The dataset includes on-state saturation voltage information for eight samples under four different test conditions (eight Excel files).
Each Excel file consists of two data columns: one for cycle numbers and the other for on-state saturation voltage.
Although these data were collected during the power cycling test at the maximum junction temperature,
the effect of temperature increase in the on-state voltage has been compensated. Namely, the provided on-state voltage
has been unified to the corresponding to the respective 125°C or 150°C.
Citation for published version: Y. Zhang, Y. Zhang, and H. Wang, “gEOL: A Gradient-based end-of-Life criterion for
power semiconductor modules,” IEEE Trans.Power Electron.
