Power cycling test dataset (gEOL: A Gradient-based End-of-Life Criterion for Power Semiconductor Modules)

Citation Author(s):
Yichi
Zhang
Aalborg University
Yi
Zhang
Aalborg University
Huai
Wang
Aalborg University
Submitted by:
Yichi Zhang
Last updated:
Fri, 12/01/2023 - 04:40
DOI:
10.21227/ksrt-zq09
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Abstract 

The dataset includes on-state saturation voltage information for eight samples under four different test conditions.  Each Excel file consists of two data columns: one for cycle numbers and the other for on-state saturation voltage. Although these data were collected during the power cycling test at the maximum junction temperature, the effect of temperature increase in the on-state voltage has been compensated. Namely, the provided on-state voltage has been unified to the corresponding to the respective 125°C or 150°C.

More data details can be found in the article: Y. Zhang, Y. Zhang, and H. Wang, “gEOL: A Gradient-based end-of-Life criterion for power semiconductor modules,” IEEE Trans.Power Electron.

Instructions: 

The dataset includes on-state saturation voltage information for eight samples under four different test conditions (eight Excel files). 

Each Excel file consists of two data columns: one for cycle numbers and the other for on-state saturation voltage. 

Although these data were collected during the power cycling test at the maximum junction temperature,

the effect of temperature increase in the on-state voltage has been compensated. Namely, the provided on-state voltage 

has been unified to the corresponding to the respective 125°C or 150°C.

 

Citation for published version: Y. Zhang, Y. Zhang, and H. Wang, “gEOL: A Gradient-based end-of-Life criterion for

power semiconductor modules,” IEEE Trans.Power Electron.

Funding Agency: 
Independent Research Fund Denmark
Grant Number: 
1031-00024B