Scanning Electron Microscopy

The presented dataset is a supplementary material to the paper [1] and it represents the X-Ray Energy Dispersive (EDS)/ Scanning Electron Microscopy (SEM) images of a shungite-mineral particle. Pansharpening is a procedure for enhancing the spatial resolution of a multispectral image, here the EDS individual bands, with a high-spatial panchromatic image, here the SEM image. Pansharpening techniques are usually tested with remote sensed data, but the procedures have been efficient in close-range MS-PAN pairs as well [3].

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VideoSupplement "SEM-assisted (LVEM-assisted) isopotential mapping of dielectric charging of the nonwoven fabric structures using Sobel–Feldman operator (Sobel filter)" for our article in russian journal (translated in English). 

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