SEM-assisted (LVEM-assisted) isopotential mapping of the dielectric charging of the nonwoven fabric structures using Sobel–Feldman operator (Sobel filter)

Citation Author(s):
O.
Gradov
Semenov Institute of Chemical Physics
A.
Olkhov
Semenov Institute of Chemical Physics
Submitted by:
Oleg Gradov
Last updated:
Mon, 12/31/2018 - 14:35
DOI:
10.21227/tjfe-ry55
Data Format:
.mp4
License:
Creative Commons Attribution
172 Views
Categories:
Standards Research Data
Arc Flash
Neuroscience
Sensors
Wearable Sensing
Keywords:
nonwoven fabric, dielectric measurements, isopotential mapping, Sobel–Feldman operator, Sobel filter, Low Voltage Electron Microscopy, LVEM, Scanning Electron Microscopy, SEM
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Abstract 

VideoSupplement "SEM-assisted (LVEM-assisted) isopotential mapping of dielectric charging of the nonwoven fabric structures using Sobel–Feldman operator (Sobel filter)" for our article in russian journal (translated in English). 

Instructions: 

For more information see our forthcoming article in 2019.

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