Datasets
Standard Dataset
Technology Acceptance of an Interactive AR App on Resistive Circuits for Engineering Students
![](https://ieee-dataport.org/sites/default/files/styles/3x2/public/tags/images/library-1666702_1920_0.jpg?itok=suvlOQtB)
- Citation Author(s):
- Submitted by:
- Alejandro Alvar...
- Last updated:
- Thu, 10/15/2020 - 19:24
- DOI:
- 10.21227/4s6m-7061
- License:
- Categories:
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Abstract
Database for a technological acceptance research
Instructions:
SN: Subjective norm
TO: Technology optimism
TI: Technology innovativeness
PEOU: Perceived ease of use
PU: Perceived usefulness
ATU: Attitude toward using
BIU: Behavioral intention to use