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Technology Acceptance of an Interactive AR App on Resistive Circuits for Engineering Students

Citation Author(s):
Alejandro Alvarez-Marin
Submitted by:
Alejandro Alvarez-Marin
Last updated:
DOI:
10.21227/4s6m-7061
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Abstract

Database for a technological acceptance research

Instructions:

SN: Subjective norm 

TO: Technology optimism 

TI: Technology innovativeness 

PEOU: Perceived ease of use

PU: Perceived usefulness

ATU: Attitude toward using 

BIU: Behavioral intention to use