Technology Acceptance of an Interactive AR App on Resistive Circuits for Engineering Students

- Citation Author(s):
-
Alejandro Alvarez-Marin
- Submitted by:
- Alejandro Alvarez-Marin
- Last updated:
- DOI:
- 10.21227/4s6m-7061
- Categories:
Abstract
Database for a technological acceptance research
Instructions:
SN: Subjective norm
TO: Technology optimism
TI: Technology innovativeness
PEOU: Perceived ease of use
PU: Perceived usefulness
ATU: Attitude toward using
BIU: Behavioral intention to use