Cryogenic Long Channel Bulk CMOS Dataset for Cryogenic CMOS Modeling

This dataset contains cryogenic Id-Vd and Id-Vg data for N- and P-MOSFET (W/L = 10 μm/1μm) from 300 K to 4 K. These data contain the I-V data corresponding to different Vds, including the data of linear region and saturation region. A Keysight B1500A semiconductor analyzer attached to a pulse tube refrigerator was used to measure these data. The transconductance, threshold voltage, subthreshold swing, and other parameters of Cryo-CMOS can be obtained by processing these data. 

In addition, because it is difficult to obtain cryogenic data, these data are of great significance for device modeling and circuit design at cryogenic temperatures.