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Raw output waveforms from AC characterization data of nanowire cryotrons. The tested nanowire cryotrons consisted of devices with a 300 nm wide channel, and a choke width varying from 15 nm to 40 nm. The choke offset from the center of the channel was also varied from 0 um to 3 um.
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This dataset provides the resources for replicating and extending the research work. It includes the source code, videos, images, and essential results that document every stage of the study. The provided code facilitates direct implementation and validation of the methodologies, while the videos and images offer visual insights into the experimental procedures and outcomes. Key results are meticulously documented to highlight the significance of the findings.
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Quantum computing stands at the forefront of technological innovation, promising to revolutionize fields ranging from cryptography to material science by leveraging the unique properties of quantum mechanics. Central to the advancement of quantum computing is the development of efficient and scalable quantum circuits, which serve as the fundamental building blocks for quantum algorithms. Traditional static quantum circuits, while powerful, often face limitations in flexibility and efficiency, particularly as the complexity of quantum algorithms increases.
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Entrepreneurial education still faces diverse challenges, including discrepancy between the theory and the practice with regard to professional standards for credentialing and preferential access to quality training opportunity. Although the ability of Digital Learning (DL’s) is to provide scalable, adaptive and attractive learning, the issues to ensure quality assurance and the way to evaluate the skill validation are still open.
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The proposed SystemVerilog MESO models offer significantly faster simulation capabilities compared to the physical model [1], improving simulation speed while preserving essential accuracy. This enhancement enables the design of more complex circuits, including MESO cells, standard cells, and intellectual property (IP) blocks, while incorporating time multiplexing techniques.
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Analysis of bacterial biofilms is particularly challenging and important with diverse applications from systems biology to biotechnology. Among the variety of techniques that have been applied, time-of-flight secondary ion mass spectrometry (ToF-SIMS) has many promising features in studying the surface characteristics of biofilms. ToF-SIMS offers high spatial resolution and high mass accuracy, which permit surface sensitive analysis of biofilm components. Thus, ToF-SIMS provides a powerful solution to addressing the challenge of bacterial biofilm analysis.
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The dataset corresponding to the measurements performed in the article "Freehand System for Probe-Fed Antenna Diagnostics by Means of Amplitude-Only Acquisitions" is provided. In this work, a freehand acquisition system is used to characterize an integrated antenna fed by a GSG probe by means of amplitude-only measurements, with phase retrieval based on an indirect holography technique for broadband antennas. Spatial filtering and time-gating techniques are applied to eliminate the effect of the feeding probe.
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In this work, an ultrathin plasma-enhanced atomic layer deposition (PEALD) alumina (Al2O3) was first introduced between top platinum (Pt) and underneath a-IZO. As consistently verified by experiment and simulation, such interlayer fundamentally eradicate the interface oxygen deficiency and MIGS, contributing to a much higher ΦB and noticeably JR, while the optimized ultrathin thickness readily allow the electron tunneling, resulting in minimal impact on the forward current.
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This benchmark set consists of real-world industrial instances that incorporate long bit-wise optimizations and are primarily composed of datapath circuits, including adders and multipliers. It includes 8 instances in total, which can be categorized into three distinct levels of difficulty. All instances are represented as miter circuits in the AIG format, designed to compare two functionally equivalent circuits for testing purposes.
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