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- Citation Author(s):
- Submitted by:
- YIN ZENG
- Last updated:
- Tue, 02/06/2024 - 08:50
- DOI:
- 10.21227/s855-md30
- Data Format:
- License:
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Abstract
We proposed a novel method for direct characterization of transient noise and gain for a pulsed low-noise amplifier (LNA) with nanosecond resolution over a wide bandwidth.
The method employed a standard noise source and an oscilloscope to measure the time-domain output waveform of the LNA. Transient noise and gain of a gate-pulse-operated C-band LNA at two biases were measured with 50~ns resolution.
The method showed good agreement with static measurements.
The transient gain was compared with transient S-parameter and drain current measurements, which confirmed the proposed method.
Instructions:
,mat file