We proposed a novel method for direct characterization of transient noise and gain for a pulsed low-noise amplifier (LNA) with nanosecond resolution over a wide bandwidth.
The method employed a standard noise source and an oscilloscope to measure the time-domain output waveform of the LNA. Transient noise and gain of a gate-pulse-operated C-band LNA at two biases were measured with 50~ns resolution.
The method showed good agreement with static measurements.
The transient gain was compared with transient S-parameter and drain current measurements, which confirmed the proposed method.