PSD

Citation Author(s):
YIN
ZENG
Chalmers University of Technology
Submitted by:
YIN ZENG
Last updated:
Tue, 02/06/2024 - 08:50
DOI:
10.21227/s855-md30
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Abstract 

We proposed a novel method for direct characterization of transient noise and gain for a pulsed low-noise amplifier (LNA) with nanosecond resolution over a wide bandwidth. 

The method employed a standard noise source and an oscilloscope to measure the time-domain output waveform of the LNA. Transient noise and gain of a gate-pulse-operated C-band LNA at two biases were measured with 50~ns resolution. 

The method showed good agreement with static measurements. 

The transient gain was compared with transient S-parameter and drain current measurements, which confirmed the proposed method. 

Instructions: 

,mat file