We proposed a novel method for direct characterization of transient noise and gain for a pulsed low-noise amplifier (LNA) with nanosecond resolution over a wide bandwidth. 

The method employed a standard noise source and an oscilloscope to measure the time-domain output waveform of the LNA. Transient noise and gain of a gate-pulse-operated C-band LNA at two biases were measured with 50~ns resolution. 

The method showed good agreement with static measurements. 

DOI Link: 
10.21227/s855-md30
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[1] YIN ZENG, "PSD", IEEE Dataport, 2024. [Online]. Available: http://dx.doi.org/10.21227/s855-md30. Accessed: Sep. 10, 2024.
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doi = {10.21227/s855-md30},
url = {http://dx.doi.org/10.21227/s855-md30},
author = {YIN ZENG },
publisher = {IEEE Dataport},
title = {PSD},
year = {2024} }
TY - DATA
T1 - PSD
AU - YIN ZENG
PY - 2024
PB - IEEE Dataport
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YIN ZENG. (2024). PSD. IEEE Dataport. http://dx.doi.org/10.21227/s855-md30
YIN ZENG, 2024. PSD. Available at: http://dx.doi.org/10.21227/s855-md30.
YIN ZENG. (2024). "PSD." Web.
1. YIN ZENG. PSD [Internet]. IEEE Dataport; 2024. Available from : http://dx.doi.org/10.21227/s855-md30
YIN ZENG. "PSD." doi: 10.21227/s855-md30