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First Name: 
YIN
Last Name: 
ZENG

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We proposed a novel method for direct characterization of transient noise and gain for a pulsed low-noise amplifier (LNA) with nanosecond resolution over a wide bandwidth. 

The method employed a standard noise source and an oscilloscope to measure the time-domain output waveform of the LNA. Transient noise and gain of a gate-pulse-operated C-band LNA at two biases were measured with 50~ns resolution. 

The method showed good agreement with static measurements. 

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