Fault Overlay Method Infrared Image
- Citation Author(s):
-
YEN-CHIH CHUANGCHENG-CHIEN KUO
- Submitted by:
- Cheng-Chien Kuo
- Last updated:
- DOI:
- 10.21227/52ea-7b75
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- Categories:
Abstract
The failure of some electrical equipment is not due to high temperature but particular heat distribution and characteristics.
Instructions:
This data is suitable for devices that can be diagnosed with thermal image features and is applied to the monitoring and diagnosing inter-turn short-circuit faults on high voltage dry-type transformers.
