Thin film thickness of Polystyrene on the glass substrates

Citation Author(s):
Akshansh
Mishra
Department of Mechanical Engineering, Politecnico Di Milano, Milan, Italy
Devarrishi
Dixit
Department of Materials Science Engineering, Christian Albrechts University zu Kiel, Germany
Submitted by:
AKSHANSH MISHRA
Last updated:
Sun, 12/27/2020 - 13:00
DOI:
10.21227/hzb9-q353
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Abstract 

Advent in machine learning is leaving a deep impact on various sectors including the material science domain. The present paper highlights the application of various supervised machine learning regression algorithms such as polynomial regression, decision tree regression algorithm, random forest algorithm, support vector regression algorithm and artificial neural network algorithm to determine the thin film thickness of Polystyrene on the glass substrates. The results showed that polynomial regression machine-learning algorithm outperforms all other machine learning models by yielding the coefficient of determination of 0.96 approximately and mean square error of 0.04 respectively.

Instructions: 

The dataset is dealing with our recent research work on the implementation of machine learning in the domain of thin films. So this dataset can be used by the users for carrying out research for optimization purposes.

 

 

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Submitted by Jin Qiuyi on Sun, 11/21/2021 - 07:36

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