Measurement method and Built-In Self-Test (BIST) circuit architecture exploiting Compressive Sampling for frequency response characterization of Digital-to-Analog Converters

Citation Author(s):
IOAN
TUDOSA
University of SANNIO
Submitted by:
Ioan Tudosa
Last updated:
Tue, 08/04/2020 - 15:31
DOI:
10.21227/d8qf-bf71
License:
Creative Commons Attribution
225 Views
Categories:
Communications
Analog signal processing
Digital signal processing
Keywords:
Compressive Sampling; Measurement and Instrumentation; Frequency response estimation; Digital-to-Analog Converter
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Abstract 

Measurement method and Built-In Self-Test (BIST) circuit architecture exploiting Compressive Sampling for frequency response characterization of Digital-to-Analog Converters

Instructions: 

Measurement method and Built-In Self-Test (BIST) circuit architecture exploiting Compressive Sampling for frequency response characterization of Digital-to-Analog Converters

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