ELCI: edge based labeled crack image

ELCI: edge based labeled crack image

Citation Author(s):
Cho Hyunwoo, Yoon Hyuk-Jin
Submitted by:
HyunWoo Cho
Last updated:
Thu, 11/08/2018 - 10:34
DOI:
10.21227/5z39-7318
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Abstract: 

We collected real crack image data to test and analyze the image-based crack detection results. We used 18 images with 1920×1080 resolution sequentially numbered from 1 to 18. And we performed labeling operation to classify the crack image into crack and background regions. online for free use. For the selection of a crack region, we applied a simple rule of extracting a crack edge and selecting the segment matching the true value. The inner region of the selected crack edge (i.e. the space between a pair of edges) was subject to hole-filling, thereby bridging the discontinued segments arbitrarily. we named these images “edge-based labeled crack images” (ELCI), and these are available 

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Related article:

Hyunwoo Cho, Hyuk-Jin Yoon, Ju-Young Jung, "Image-based Crack Detection Using Crack Width Transform (CWT) Algorithm", IEEE Access, 10.1109/ACCESS.2018.2875889

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[1] Cho Hyunwoo, Yoon Hyuk-Jin, "ELCI: edge based labeled crack image", IEEE Dataport, 2018. [Online]. Available: http://dx.doi.org/10.21227/5z39-7318. Accessed: Aug. 25, 2019.
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doi = {10.21227/5z39-7318},
url = {http://dx.doi.org/10.21227/5z39-7318},
author = {Cho Hyunwoo; Yoon Hyuk-Jin },
publisher = {IEEE Dataport},
title = {ELCI: edge based labeled crack image},
year = {2018} }
TY - DATA
T1 - ELCI: edge based labeled crack image
AU - Cho Hyunwoo; Yoon Hyuk-Jin
PY - 2018
PB - IEEE Dataport
UR - 10.21227/5z39-7318
ER -
Cho Hyunwoo, Yoon Hyuk-Jin. (2018). ELCI: edge based labeled crack image. IEEE Dataport. http://dx.doi.org/10.21227/5z39-7318
Cho Hyunwoo, Yoon Hyuk-Jin, 2018. ELCI: edge based labeled crack image. Available at: http://dx.doi.org/10.21227/5z39-7318.
Cho Hyunwoo, Yoon Hyuk-Jin. (2018). "ELCI: edge based labeled crack image." Web.
1. Cho Hyunwoo, Yoon Hyuk-Jin. ELCI: edge based labeled crack image [Internet]. IEEE Dataport; 2018. Available from : http://dx.doi.org/10.21227/5z39-7318
Cho Hyunwoo, Yoon Hyuk-Jin. "ELCI: edge based labeled crack image." doi: 10.21227/5z39-7318