Cho Hyunwoo, Yoon Hyuk-Jin
[1] Cho Hyunwoo, Yoon Hyuk-Jin,
"ELCI: edge based labeled crack image",
IEEE Dataport,
2018. [Online]. Available: http://dx.doi.org/10.21227/5z39-7318. Accessed: Feb. 15, 2025.
@data{5z39-7318-18,
doi = {10.21227/5z39-7318},
url = {http://dx.doi.org/10.21227/5z39-7318},
author = {Cho Hyunwoo; Yoon Hyuk-Jin },
publisher = {IEEE Dataport},
title = {ELCI: edge based labeled crack image},
year = {2018} }
doi = {10.21227/5z39-7318},
url = {http://dx.doi.org/10.21227/5z39-7318},
author = {Cho Hyunwoo; Yoon Hyuk-Jin },
publisher = {IEEE Dataport},
title = {ELCI: edge based labeled crack image},
year = {2018} }
TY - DATA
T1 - ELCI: edge based labeled crack image
AU - Cho Hyunwoo; Yoon Hyuk-Jin
PY - 2018
PB - IEEE Dataport
UR - 10.21227/5z39-7318
ER -
T1 - ELCI: edge based labeled crack image
AU - Cho Hyunwoo; Yoon Hyuk-Jin
PY - 2018
PB - IEEE Dataport
UR - 10.21227/5z39-7318
ER -
Cho Hyunwoo, Yoon Hyuk-Jin.
(2018).
ELCI: edge based labeled crack image.
IEEE Dataport.
http://dx.doi.org/10.21227/5z39-7318
Cho Hyunwoo, Yoon Hyuk-Jin,
2018.
ELCI: edge based labeled crack image.
Available at:
http://dx.doi.org/10.21227/5z39-7318.
Cho Hyunwoo, Yoon Hyuk-Jin.
(2018).
"ELCI: edge based labeled crack image."
Web.
1. Cho Hyunwoo, Yoon Hyuk-Jin.
ELCI: edge based labeled crack image [Internet].
IEEE Dataport; 2018.
Available from :
http://dx.doi.org/10.21227/5z39-7318
Cho Hyunwoo, Yoon Hyuk-Jin.
"ELCI: edge based labeled crack image."
doi:
10.21227/5z39-7318