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First Name: 
Sijie
Last Name: 
Ma

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The analysis of complex scattering patterns in SAR images of high-voltage power lines is important to comprehend the multi-reflection effects of these cylindrical shape structures. Such insights are invaluable for applications related to inspection management, particularly in safety analysis and ongoing monitoring. This paper introduces a novel point scattering tracing method to dissect the intricate multi-reflection effects of power lines in high-resolution X-band SAR data.

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