test

test

Citation Author(s):
Chuandong
Su
Hangzhou Dianzi university
Submitted by:
Chuandong Su
Last updated:
Fri, 02/21/2020 - 04:58
DOI:
10.21227/z44p-k860
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Dataset Views:
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Abstract: 

test

Instructions: 

test

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[1] Chuandong Su, "test", IEEE Dataport, 2019. [Online]. Available: http://dx.doi.org/10.21227/z44p-k860. Accessed: May. 28, 2020.
@data{z44p-k860-19,
doi = {10.21227/z44p-k860},
url = {http://dx.doi.org/10.21227/z44p-k860},
author = {Chuandong Su },
publisher = {IEEE Dataport},
title = {test},
year = {2019} }
TY - DATA
T1 - test
AU - Chuandong Su
PY - 2019
PB - IEEE Dataport
UR - 10.21227/z44p-k860
ER -
Chuandong Su. (2019). test. IEEE Dataport. http://dx.doi.org/10.21227/z44p-k860
Chuandong Su, 2019. test. Available at: http://dx.doi.org/10.21227/z44p-k860.
Chuandong Su. (2019). "test." Web.
1. Chuandong Su. test [Internet]. IEEE Dataport; 2019. Available from : http://dx.doi.org/10.21227/z44p-k860
Chuandong Su. "test." doi: 10.21227/z44p-k860