SJC value test data

Name: SJC value test data
Creator: chuck shen
License: https://creativecommons.org/licenses/by/4.0/
Keywords: IoT

Citation Author(s):: chuck shen (SUSTech)
Submitted by:: chuck shen
Last updated:: Wed, 05/18/2022 - 02:18
DOI:: 10.21227/194j-ym25
Research Article Link:: A Fast Self-Jamming Cancellation Architecture and Algorithm for Passive RFID Se…

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Abstract

Original SJC value test data for papers.

Instructions:

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Dataset Files

20200901SJCtestdata.xlsx (Size: 23.72 KB)

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DATASET TYPE: data
USERID: 1353045
DATASETID: 14627

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Dataset Citation

chuck shen, "SJC value test data", IEEE Dataport, November 11, 2020, doi:10.21227/194j-ym25

@data{194j-ym25-20,
doi = {10.21227/194j-ym25},
url = {https://dx.doi.org/10.21227/194j-ym25},
author = {chuck shen},
publisher = {IEEE Dataport},
title = {SJC value test data},
year = {2020} }

TY - DATA
T1 - SJC value test data
AU - chuck shen
PY - 2020
PB - IEEE Dataport
UR - 10.21227/194j-ym25
ER -

chuck shen (2020). SJC value test data. IEEE Dataport. https://dx.doi.org/10.21227/194j-ym25

chuck shen 2020 SJC value test data. Available at: https://dx.doi.org/10.21227/194j-ym25

chuck shen.(2020). "SJC value test data." Web,

1. chuck shen. SJC value test data [Internet]. IEEE Dataport; 2020. Available from: https://dx.doi.org/10.21227/194j-ym25

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SJC value test data

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