NIST test results for the paper "Towards a Practical Runtime-Accessible True Random Number Generator Based on Commercial Off-The-Shelf Resistive Random Access Memory Modules"

This dataset contains detailed NIST test suite measurements for both the NIST SP 800-22 statistical and NIST SP 800-90B entropy source test suite relevant to the paper "Towards a Practical Runtime-Accessible True Random Number Generator Based on Commercial Off-The-Shelf Resistive Random Access Memory Modules". In this work, ReRAM modules of two different manufacturers (Adesto Technologies and Fujitsu) have been tested, providing almost equally good results. In particular, the proposed TRNG can successfully pass all the tests of the NIST SP800-22 Statistical Test Suite and NIST SP800-90B Entropy Source Test Suite at a wide range of temperatures. At the same time, the TRNG achieves a throughput of at least 155 bits per second which is sufficient for many practical applications such as security protocols for the IoT and in-vehicle networks.