Fault Overlay Method Infrared Image

Citation Author(s):
YEN-CHIH
CHUANG
CHENG-CHIEN
KUO
Submitted by:
Cheng-Chien Kuo
Last updated:
Mon, 07/08/2024 - 15:59
DOI:
10.21227/52ea-7b75
License:
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Abstract 

The failure of some electrical equipment is not due to high temperature but particular heat distribution and characteristics.

Instructions: 

This data is suitable for devices that can be diagnosed with thermal image features and is applied to the monitoring and diagnosing inter-turn short-circuit faults on high voltage dry-type transformers.