This dataset contains detailed NIST test suite measurements for both the NIST SP 800-22 statistical and NIST SP 800-90B entropy source test suite relevant to the paper "Towards a Practical Runtime-Accessible True Random Number Generator Based on Commercial Off-The-Shelf Resistive Random Access Memory Modules". In this work, ReRAM modules of two different manufacturers (Adesto Technologies and Fujitsu) have been tested, providing almost equally good results.