Demonstratable lifetime of different RDTs - simulation and calculation

Citation Author(s):
Philipp
Mell
Submitted by:
Philipp Mell
Last updated:
Fri, 11/22/2024 - 10:50
DOI:
10.21227/exfd-gg78
Data Format:
Excel Spreadsheets
License:
Creative Commons Attribution
13 Views
Categories:
Reliability
Keywords:
Reliability demonstration, reliability test planning, statistical power analysis, probability of test success, delta method
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Abstract 

The dataset file contains data of different reliability demonstration tests (RDTs). For this dataset, an RDT is a failure-based test for a product with Weibull distributed failure times (due to a single failure mechanism), which are load-dependent according to the inverse power law, and which are evaluated using maximum likelihood estimation. Each RDT is capable of demonstrating a particular lifetime t_RCS for a given required reliability and confidence, and with probability of test success of 80 %. t_RCS is obtained from both a classical simulative approach, including MLE and Fisher confidence bounds, and from an analytic approximation. The error of the latter, as well as the indices of a reduced dataset are given.

Instructions: 

The data is structured in different worksheets:

 - RDT_configs contains the configuration data of 8550 RDTs. An RDT configuration in this dataset consists of 8 parameters:

    - n_L, the number of units tested on a low (L) load level

    - n_H, the number of units tested on a high (H) load level

    - V_L, the low load level, defined in relation to the field load level

    - V_H, the high load level, defined in relation to the field load level

    - b, the Weibull shape parameter of the time-to-failure distribution

    - A, the load dependency parameter of the inverse power law

    - R, the required reliability

    - C, the required confidence

 - t_RCS_sim contains the simulated demonstratable lifetime t_RCS for the 8550 RDTs. Each RDT has been repeatedly simulated (i.e., virtually conducted and evaluated using MLE) 100,000 times. For both the lifetime quantile and the test result distribution, either a normal (N) or a lognormal (LN) distribution has been assumed, yielding results for the 4 combinations N-N, N-LN, LN-N, LN-LN.

 - t_RCS_ana contains the analytically approximated demonstratable lifetime t_RCS for the 8550 RDTs for the 4 distribution assumptions.

 - e contains the relative error of each analytic result over the respective simulative result

 - indRedData contains the indices of the RDT configurations used as reduced dataset, where 150 cases with unrealistic configurations have been removed.

Dataset Files

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