test 20180517a

test 20180517a

Citation Author(s):
Kun-Chou Lee
Submitted by:
Kun Lee
Last updated:
Thu, 11/08/2018 - 10:34
DOI:
10.21227/H28D5V
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Abstract: 

test

Instructions: 

Readme

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[1] Kun-Chou Lee, "test 20180517a", IEEE Dataport, 2018. [Online]. Available: http://dx.doi.org/10.21227/H28D5V. Accessed: Jul. 09, 2020.
@data{h28d5v-18,
doi = {10.21227/H28D5V},
url = {http://dx.doi.org/10.21227/H28D5V},
author = {Kun-Chou Lee },
publisher = {IEEE Dataport},
title = {test 20180517a},
year = {2018} }
TY - DATA
T1 - test 20180517a
AU - Kun-Chou Lee
PY - 2018
PB - IEEE Dataport
UR - 10.21227/H28D5V
ER -
Kun-Chou Lee. (2018). test 20180517a. IEEE Dataport. http://dx.doi.org/10.21227/H28D5V
Kun-Chou Lee, 2018. test 20180517a. Available at: http://dx.doi.org/10.21227/H28D5V.
Kun-Chou Lee. (2018). "test 20180517a." Web.
1. Kun-Chou Lee. test 20180517a [Internet]. IEEE Dataport; 2018. Available from : http://dx.doi.org/10.21227/H28D5V
Kun-Chou Lee. "test 20180517a." doi: 10.21227/H28D5V