Continuous Pulse Test Waveform for Current Sharing of Paralleled SiC MOSFETs

Citation Author(s):
Liyang
Du
University of Arkansas
Xia
Du
University of Arkansas
Shuang
Zhao
Hefei University of Technology
Alan
Mantooth
University of Arkansas
Submitted by:
Shuang Zhao
Last updated:
Tue, 11/15/2022 - 01:50
DOI:
10.21227/mb91-vq11
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Abstract 

The supplementary file includes the experimental waveform which we recorded in the continuous operating test. It shows the dynamic response of the close-loop control. From the waveform, both the static and dynamic current are not matched at the beginning. The DSP measures the errors and the Vcc is changed by adjusting the duty cycle of the buck converter. The transient current is matched via adjusting the lagging time between the gate signals. After a couple of cycles, the current become balanced.

Instructions: 

The supplementary file includes the experimental waveform which we recorded in the continuous operating test. It shows the dynamic response of the close-loop control. From the waveform, both the static and dynamic current are not matched at the beginning. The DSP measures the errors and the Vcc is changed by adjusting the duty cycle of the buck converter. The transient current is matched via adjusting the lagging time between the gate signals. After a couple of cycles, the current become balanced.

Comments

Thank you so much..

Submitted by IBRAHIM ALHURAYYIS on Tue, 11/22/2022 - 09:26

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