Block I/O trace

NAND Flash-based Synthetic Block IO traces from FIO benchmark is focused on understanding characteristics of flash memoy under various access patterns. The dataset comprises distinct seven wrorkloads.

Workoad 1 and 2 are sequential write workloads. Workload 1 represents the typical seuqential write pattern, while Workload 2 represents partioning sequential write pattern, dividing 8 logical partitions.

Workload 3 and 4 are random write workloads. Workload 3 follows a uniform random distribution, and Worklod 4 follows the Zipfian random distribution with a theta of 0.8.