Multi-target classification; Binary relevance; Classifier chains; Label power-sets; RAKEL

The Defect Tracking dataset provides a comprehensive resource for software maintenance and defect prediction research. This dataset, downloaded from the Jira Spring website, includes detailed defect data from a variety of Spring application projects such as Spring Framework, Spring Boot, Spring Security, Spring Data, and others. It encompasses numerous attributes, including issue summaries, types, statuses, priorities, resolution details, and additional relevant information.