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Nanowire cryotron characterization
- Citation Author(s):
-
AlejandroSimon
Massachusetts Institute of Technology - Submitted by:
- Alejandro Simon
- Last updated:
- Thu, 12/19/2024 - 15:08
- DOI:
- 10.21227/7kax-0975
- License:
13 Views- Categories:
- Keywords:
Abstract
Raw output waveforms from AC characterization data of nanowire cryotrons. The tested nanowire cryotrons consisted of devices with a 300 nm wide channel, and a choke width varying from 15 nm to 40 nm. The choke offset from the center of the channel was also varied from 0 um to 3 um. Details of the measurements can be found in the corresponding article: https://arxiv.org/abs/2409.17366. A sweep of channel currents, pulse durations, and pulse frequencies was performed for each device. Contact the corresponding author for questions regarding the labeling or further information about the measurements or data.
Each data file is labeled with a letter and number corresponding to a device and the following number is the supplied gate current with the underscore denoting a decimal point. Due to the size of these files, they are also split up into multiple data files. The letter corresponds to the width of the choke and the number corresponds to the offset. The following key gives the translation: Choke width A = 15 nm, B = 17.5 nm, C = 20 nm, D = 22.5 nm, E = 25 nm, F = 30 nm, G = 35 nm, H = 40 nm; Choke offset: 1 - 0 um, 2 - 0.4 um, 3 - 0.8 um, 4-1.2 um, 5 - 1.6 um, 6 - 2 um, 7 - 2.5 um, 8 - 3um. A sweep of channel currents, pulse durations, and pulse frequencies was performed for each device. Contact the corresponding author for questions regarding the labeling or further information about the data.
