[1] Maman Ahmad Khan, Barry Hayes,
"For paper "A Reduced Electrically-Equivalent Model of the IEEE European Low Voltage Test Feeder"",
IEEE Dataport,
2020. [Online]. Available: http://dx.doi.org/10.21227/0d2n-j565. Accessed: Dec. 26, 2024.
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doi = {10.21227/0d2n-j565},
url = {http://dx.doi.org/10.21227/0d2n-j565},
author = {Maman Ahmad Khan; Barry Hayes },
publisher = {IEEE Dataport},
title = {For paper "A Reduced Electrically-Equivalent Model of the IEEE European Low Voltage Test Feeder"},
year = {2020} }
doi = {10.21227/0d2n-j565},
url = {http://dx.doi.org/10.21227/0d2n-j565},
author = {Maman Ahmad Khan; Barry Hayes },
publisher = {IEEE Dataport},
title = {For paper "A Reduced Electrically-Equivalent Model of the IEEE European Low Voltage Test Feeder"},
year = {2020} }
TY - DATA
T1 - For paper "A Reduced Electrically-Equivalent Model of the IEEE European Low Voltage Test Feeder"
AU - Maman Ahmad Khan; Barry Hayes
PY - 2020
PB - IEEE Dataport
UR - 10.21227/0d2n-j565
ER -
T1 - For paper "A Reduced Electrically-Equivalent Model of the IEEE European Low Voltage Test Feeder"
AU - Maman Ahmad Khan; Barry Hayes
PY - 2020
PB - IEEE Dataport
UR - 10.21227/0d2n-j565
ER -
Maman Ahmad Khan, Barry Hayes.
(2020).
For paper "A Reduced Electrically-Equivalent Model of the IEEE European Low Voltage Test Feeder".
IEEE Dataport.
http://dx.doi.org/10.21227/0d2n-j565
Maman Ahmad Khan, Barry Hayes,
2020.
For paper "A Reduced Electrically-Equivalent Model of the IEEE European Low Voltage Test Feeder".
Available at:
http://dx.doi.org/10.21227/0d2n-j565.
Maman Ahmad Khan, Barry Hayes.
(2020).
"For paper "A Reduced Electrically-Equivalent Model of the IEEE European Low Voltage Test Feeder"."
Web.
1. Maman Ahmad Khan, Barry Hayes.
For paper "A Reduced Electrically-Equivalent Model of the IEEE European Low Voltage Test Feeder" [Internet].
IEEE Dataport; 2020.
Available from :
http://dx.doi.org/10.21227/0d2n-j565
Maman Ahmad Khan, Barry Hayes.
"For paper "A Reduced Electrically-Equivalent Model of the IEEE European Low Voltage Test Feeder"."
doi:
10.21227/0d2n-j565