[1] Han Jing,
"TEST DATA",
IEEE Dataport,
2023. [Online]. Available: http://dx.doi.org/10.21227/42kd-t196. Accessed: Dec. 26, 2024.
@data{42kd-t196-23,
doi = {10.21227/42kd-t196},
url = {http://dx.doi.org/10.21227/42kd-t196},
author = {Han Jing },
publisher = {IEEE Dataport},
title = {TEST DATA},
year = {2023} }
doi = {10.21227/42kd-t196},
url = {http://dx.doi.org/10.21227/42kd-t196},
author = {Han Jing },
publisher = {IEEE Dataport},
title = {TEST DATA},
year = {2023} }
TY - DATA
T1 - TEST DATA
AU - Han Jing
PY - 2023
PB - IEEE Dataport
UR - 10.21227/42kd-t196
ER -
T1 - TEST DATA
AU - Han Jing
PY - 2023
PB - IEEE Dataport
UR - 10.21227/42kd-t196
ER -
Han Jing.
(2023).
TEST DATA.
IEEE Dataport.
http://dx.doi.org/10.21227/42kd-t196
Han Jing,
2023.
TEST DATA.
Available at:
http://dx.doi.org/10.21227/42kd-t196.
Han Jing.
(2023).
"TEST DATA."
Web.
1. Han Jing.
TEST DATA [Internet].
IEEE Dataport; 2023.
Available from :
http://dx.doi.org/10.21227/42kd-t196
Han Jing.
"TEST DATA."
doi:
10.21227/42kd-t196