[1] ZESHENG LIN,
"defect detection dataset",
IEEE Dataport,
2020. [Online]. Available: http://dx.doi.org/10.21227/ekkr-de53. Accessed: Jan. 18, 2025.
@data{ekkr-de53-20,
doi = {10.21227/ekkr-de53},
url = {http://dx.doi.org/10.21227/ekkr-de53},
author = {ZESHENG LIN },
publisher = {IEEE Dataport},
title = {defect detection dataset},
year = {2020} }
doi = {10.21227/ekkr-de53},
url = {http://dx.doi.org/10.21227/ekkr-de53},
author = {ZESHENG LIN },
publisher = {IEEE Dataport},
title = {defect detection dataset},
year = {2020} }
TY - DATA
T1 - defect detection dataset
AU - ZESHENG LIN
PY - 2020
PB - IEEE Dataport
UR - 10.21227/ekkr-de53
ER -
T1 - defect detection dataset
AU - ZESHENG LIN
PY - 2020
PB - IEEE Dataport
UR - 10.21227/ekkr-de53
ER -
ZESHENG LIN.
(2020).
defect detection dataset.
IEEE Dataport.
http://dx.doi.org/10.21227/ekkr-de53
ZESHENG LIN,
2020.
defect detection dataset.
Available at:
http://dx.doi.org/10.21227/ekkr-de53.
ZESHENG LIN.
(2020).
"defect detection dataset."
Web.
1. ZESHENG LIN.
defect detection dataset [Internet].
IEEE Dataport; 2020.
Available from :
http://dx.doi.org/10.21227/ekkr-de53
ZESHENG LIN.
"defect detection dataset."
doi:
10.21227/ekkr-de53