[1] Hongyu Sun, "A deep learning database and network for focusing guided wave defect detection", IEEE Dataport, 2020. [Online]. Available: http://dx.doi.org/ERROR: error: The attribute 'style' is not allowed. at line 28, column 0. Accessed: Dec. 21, 2024.

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doi = {ERROR: error: The attribute 'style' is not allowed. at line 28, column 0},
url = {http://dx.doi.org/ERROR: error: The attribute 'style' is not allowed. at line 28, column 0},
author = {Hongyu Sun },
publisher = {IEEE Dataport},
title = {A deep learning database and network for focusing guided wave defect detection},
year = {2020} }

TY - DATA
T1 - A deep learning database and network for focusing guided wave defect detection
AU - Hongyu Sun
PY - 2020
PB - IEEE Dataport
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Hongyu Sun. (2020). A deep learning database and network for focusing guided wave defect detection. IEEE Dataport. http://dx.doi.org/ERROR: error: The attribute 'style' is not allowed. at line 28, column 0

Hongyu Sun, 2020. A deep learning database and network for focusing guided wave defect detection. Available at: http://dx.doi.org/ERROR: error: The attribute 'style' is not allowed. at line 28, column 0.

Hongyu Sun. (2020). "A deep learning database and network for focusing guided wave defect detection." Web.

1. Hongyu Sun. A deep learning database and network for focusing guided wave defect detection [Internet]. IEEE Dataport; 2020. Available from : http://dx.doi.org/ERROR: error: The attribute 'style' is not allowed. at line 28, column 0

Hongyu Sun. "A deep learning database and network for focusing guided wave defect detection." doi: ERROR: error: The attribute 'style' is not allowed. at line 28, column 0