Dataset for Relationship between Usability, Academic Performance, and Emotions Experienced in Learning.  Augmented Reality and Education in Electronics.

Dataset Files

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[1] Alejandro Alvarez-Marin, "Augmented Reality and Education in Electronics: Relationship between Usability, Academic Performance, and Emotions Experienced in Learning", IEEE Dataport, 2022. [Online]. Available: http://dx.doi.org/10.21227/sc0z-j751. Accessed: May. 25, 2024.
@data{sc0z-j751-22,
doi = {10.21227/sc0z-j751},
url = {http://dx.doi.org/10.21227/sc0z-j751},
author = {Alejandro Alvarez-Marin },
publisher = {IEEE Dataport},
title = {Augmented Reality and Education in Electronics: Relationship between Usability, Academic Performance, and Emotions Experienced in Learning},
year = {2022} }
TY - DATA
T1 - Augmented Reality and Education in Electronics: Relationship between Usability, Academic Performance, and Emotions Experienced in Learning
AU - Alejandro Alvarez-Marin
PY - 2022
PB - IEEE Dataport
UR - 10.21227/sc0z-j751
ER -
Alejandro Alvarez-Marin. (2022). Augmented Reality and Education in Electronics: Relationship between Usability, Academic Performance, and Emotions Experienced in Learning. IEEE Dataport. http://dx.doi.org/10.21227/sc0z-j751
Alejandro Alvarez-Marin, 2022. Augmented Reality and Education in Electronics: Relationship between Usability, Academic Performance, and Emotions Experienced in Learning. Available at: http://dx.doi.org/10.21227/sc0z-j751.
Alejandro Alvarez-Marin. (2022). "Augmented Reality and Education in Electronics: Relationship between Usability, Academic Performance, and Emotions Experienced in Learning." Web.
1. Alejandro Alvarez-Marin. Augmented Reality and Education in Electronics: Relationship between Usability, Academic Performance, and Emotions Experienced in Learning [Internet]. IEEE Dataport; 2022. Available from : http://dx.doi.org/10.21227/sc0z-j751
Alejandro Alvarez-Marin. "Augmented Reality and Education in Electronics: Relationship between Usability, Academic Performance, and Emotions Experienced in Learning." doi: 10.21227/sc0z-j751