[1] Tang Han,
"TEST6",
IEEE Dataport,
2021. [Online]. Available: http://dx.doi.org/10.21227/mb05-1763. Accessed: Jan. 12, 2025.
@data{mb05-1763-21,
doi = {10.21227/mb05-1763},
url = {http://dx.doi.org/10.21227/mb05-1763},
author = {Tang Han },
publisher = {IEEE Dataport},
title = {TEST6},
year = {2021} }
doi = {10.21227/mb05-1763},
url = {http://dx.doi.org/10.21227/mb05-1763},
author = {Tang Han },
publisher = {IEEE Dataport},
title = {TEST6},
year = {2021} }
TY - DATA
T1 - TEST6
AU - Tang Han
PY - 2021
PB - IEEE Dataport
UR - 10.21227/mb05-1763
ER -
T1 - TEST6
AU - Tang Han
PY - 2021
PB - IEEE Dataport
UR - 10.21227/mb05-1763
ER -
Tang Han.
(2021).
TEST6.
IEEE Dataport.
http://dx.doi.org/10.21227/mb05-1763
Tang Han,
2021.
TEST6.
Available at:
http://dx.doi.org/10.21227/mb05-1763.
Tang Han.
(2021).
"TEST6."
Web.
1. Tang Han.
TEST6 [Internet].
IEEE Dataport; 2021.
Available from :
http://dx.doi.org/10.21227/mb05-1763
Tang Han.
"TEST6."
doi:
10.21227/mb05-1763