[1] Guangsheng Pan, "Test Data of EH-IES", IEEE Dataport, 2019. [Online]. Available: http://dx.doi.org/10.21227/14kq-8q84. Accessed: Mar. 18, 2025.

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doi = {10.21227/14kq-8q84},
url = {http://dx.doi.org/10.21227/14kq-8q84},
author = {Guangsheng Pan },
publisher = {IEEE Dataport},
title = {Test Data of EH-IES},
year = {2019} }

TY - DATA
T1 - Test Data of EH-IES
AU - Guangsheng Pan
PY - 2019
PB - IEEE Dataport
UR - 10.21227/14kq-8q84
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Guangsheng Pan. (2019). Test Data of EH-IES. IEEE Dataport. http://dx.doi.org/10.21227/14kq-8q84

Guangsheng Pan, 2019. Test Data of EH-IES. Available at: http://dx.doi.org/10.21227/14kq-8q84.

Guangsheng Pan. (2019). "Test Data of EH-IES." Web.

1. Guangsheng Pan. Test Data of EH-IES [Internet]. IEEE Dataport; 2019. Available from : http://dx.doi.org/10.21227/14kq-8q84

Guangsheng Pan. "Test Data of EH-IES." doi: 10.21227/14kq-8q84