[1] C XiuJian,
"Open-set defect detection",
IEEE Dataport,
2024. [Online]. Available: http://dx.doi.org/10.21227/x5m6-vs48. Accessed: Oct. 10, 2024.
@data{x5m6-vs48-24,
doi = {10.21227/x5m6-vs48},
url = {http://dx.doi.org/10.21227/x5m6-vs48},
author = {C XiuJian },
publisher = {IEEE Dataport},
title = {Open-set defect detection},
year = {2024} }
doi = {10.21227/x5m6-vs48},
url = {http://dx.doi.org/10.21227/x5m6-vs48},
author = {C XiuJian },
publisher = {IEEE Dataport},
title = {Open-set defect detection},
year = {2024} }
TY - DATA
T1 - Open-set defect detection
AU - C XiuJian
PY - 2024
PB - IEEE Dataport
UR - 10.21227/x5m6-vs48
ER -
T1 - Open-set defect detection
AU - C XiuJian
PY - 2024
PB - IEEE Dataport
UR - 10.21227/x5m6-vs48
ER -
C XiuJian.
(2024).
Open-set defect detection.
IEEE Dataport.
http://dx.doi.org/10.21227/x5m6-vs48
C XiuJian,
2024.
Open-set defect detection.
Available at:
http://dx.doi.org/10.21227/x5m6-vs48.
C XiuJian.
(2024).
"Open-set defect detection."
Web.
1. C XiuJian.
Open-set defect detection [Internet].
IEEE Dataport; 2024.
Available from :
http://dx.doi.org/10.21227/x5m6-vs48
C XiuJian.
"Open-set defect detection."
doi:
10.21227/x5m6-vs48