The detection of anomalous structures in natural image data is of utmost importance for numerous tasks in the field of computer vision. The development of methods for unsupervised anomaly detection requires data on which to train and evaluate new approaches and ideas. We introduce the MVTec Anomaly Detection (MVTec AD) dataset containing 5354 high-resolution color images of different object and texture categories. It contains normal, i.e., defect-free, images intended for training and images with anomalies intended for testing.

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[1] C XiuJian, "Open-set defect detection", IEEE Dataport, 2024. [Online]. Available: http://dx.doi.org/10.21227/x5m6-vs48. Accessed: Oct. 10, 2024.
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doi = {10.21227/x5m6-vs48},
url = {http://dx.doi.org/10.21227/x5m6-vs48},
author = {C XiuJian },
publisher = {IEEE Dataport},
title = {Open-set defect detection},
year = {2024} }
TY - DATA
T1 - Open-set defect detection
AU - C XiuJian
PY - 2024
PB - IEEE Dataport
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C XiuJian. (2024). Open-set defect detection. IEEE Dataport. http://dx.doi.org/10.21227/x5m6-vs48
C XiuJian, 2024. Open-set defect detection. Available at: http://dx.doi.org/10.21227/x5m6-vs48.
C XiuJian. (2024). "Open-set defect detection." Web.
1. C XiuJian. Open-set defect detection [Internet]. IEEE Dataport; 2024. Available from : http://dx.doi.org/10.21227/x5m6-vs48
C XiuJian. "Open-set defect detection." doi: 10.21227/x5m6-vs48