The foundation of detection relies on the surface micro-defect images of KDP, and the effectiveness of the detection model depends on the quality of these images. Higher quality images can pinpoint the shape details and boundary features of defects, thereby enhancing the overall detection capability.

DOI Link: 
10.21227/fm8f-8t88
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[1] Shuhao He, "Images of micro-craters and micro-cracks on the surface of KDP crystals", IEEE Dataport, 2024. [Online]. Available: http://dx.doi.org/10.21227/fm8f-8t88. Accessed: Oct. 15, 2024.
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doi = {10.21227/fm8f-8t88},
url = {http://dx.doi.org/10.21227/fm8f-8t88},
author = {Shuhao He },
publisher = {IEEE Dataport},
title = {Images of micro-craters and micro-cracks on the surface of KDP crystals},
year = {2024} }
TY - DATA
T1 - Images of micro-craters and micro-cracks on the surface of KDP crystals
AU - Shuhao He
PY - 2024
PB - IEEE Dataport
UR - 10.21227/fm8f-8t88
ER -
Shuhao He. (2024). Images of micro-craters and micro-cracks on the surface of KDP crystals. IEEE Dataport. http://dx.doi.org/10.21227/fm8f-8t88
Shuhao He, 2024. Images of micro-craters and micro-cracks on the surface of KDP crystals. Available at: http://dx.doi.org/10.21227/fm8f-8t88.
Shuhao He. (2024). "Images of micro-craters and micro-cracks on the surface of KDP crystals." Web.
1. Shuhao He. Images of micro-craters and micro-cracks on the surface of KDP crystals [Internet]. IEEE Dataport; 2024. Available from : http://dx.doi.org/10.21227/fm8f-8t88
Shuhao He. "Images of micro-craters and micro-cracks on the surface of KDP crystals." doi: 10.21227/fm8f-8t88